Alberto Tagliaferri
Alberto Tagliaferri
Professor of Physics, Politecnico di Milano, Italy
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Low Energy Electronic Excitations in the Layered Cuprates Studied by Copper Resonant Inelastic X-Ray Scattering
G Ghiringhelli, NB Brookes, E Annese, H Berger, C Dallera, M Grioni, ...
Physical review letters 92 (11), 117406, 2004
Covalency in the uranyl ion: A polarized x-ray spectroscopic study
RG Denning, JC Green, TE Hutchings, C Dallera, A Tagliaferri, K Giarda, ...
The Journal of Chemical Physics 117 (17), 8008-8020, 2002
Unraveling Orbital Ordering in
SS Dhesi, A Mirone, C De Nadai, P Ohresser, P Bencok, NB Brookes, ...
Physical review letters 92 (5), 056403, 2004
Experimental evidence of the ferrimagnetic ground state of Sr2FeMoO6 probed by X-ray magnetic circular dichroism
M Besse, V Cros, A Barthélémy, H Jaffrès, J Vogel, F Petroff, A Mirone, ...
Europhysics Letters 60 (4), 608, 2002
NiO as a test case for high resolution resonant inelastic soft x-ray scattering
G Ghiringhelli, M Matsubara, C Dallera, F Fracassi, R Gusmeroli, ...
Journal of Physics: Condensed Matter 17 (35), 5397, 2005
X-ray magnetic-circular-dichroism spectra on the superparamagnetic transition-metal ion clusters Mn12 and Fe8
P Ghigna, A Campana, A Lascialfari, A Caneschi, D Gatteschi, ...
Physical Review B 64 (13), 132413, 2001
Perpendicular Interlayer Coupling in Trilayers
J Camarero, Y Pennec, J Vogel, M Bonfim, S Pizzini, F Ernult, F Fettar, ...
Physical review letters 91 (2), 027201, 2003
Resonant inelastic x-ray scattering of : edge measurements and assessment of their interpretation
G Ghiringhelli, M Matsubara, C Dallera, F Fracassi, A Tagliaferri, ...
Physical Review B—Condensed Matter and Materials Physics 73 (3), 035111, 2006
transition in metallic studied by resonant x-ray spectroscopies
C Dallera, M Grioni, A Palenzona, M Taguchi, E Annese, G Ghiringhelli, ...
Physical Review B—Condensed Matter and Materials Physics 70 (8), 085112, 2004
Magnetic Circular Dichroism in Resonant Raman Scattering in the Perpendicular Geometry at the edge of Transition Metal Systems
L Braicovich, G Van Der Laan, G Ghiringhelli, A Tagliaferri, ...
Physical review letters 82 (7), 1566, 1999
Polarization of Fe (001) covered by MgO analyzed by spin-resolved x-ray photoemission spectroscopy
M Sicot, S Andrieu, P Turban, Y Fagot-Revurat, H Cercellier, A Tagliaferri, ...
Physical Review B 68 (18), 184406, 2003
Field dependent exchange coupling in NiO/Co bilayers
J Camarero, Y Pennec, J Vogel, S Pizzini, M Cartier, F Fettar, F Ernult, ...
Physical Review B 67 (2), 020413, 2003
Epitaxial growth and characterization of layered magnetic nanostructures
R Bertacco, M Cantoni, M Riva, A Tagliaferri, F Ciccacci
Applied surface science 252 (5), 1754-1764, 2005
Gaining efficiency and resolution in soft X-ray emission spectrometers thanks to directly illuminated CCD detectors
ME Dinardo, A Piazzalunga, L Braicovich, V Bisogni, C Dallera, K Giarda, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2007
MariX, an advanced MHz-class repetition rate X-ray source for linear regime time-resolved spectroscopy and photon scattering
L Serafini, A Bacci, A Bellandi, M Bertucci, M Bolognesi, A Bosotti, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2019
Combining - and -edge resonant inelastic x-ray scattering for studies of transition metal compounds
SG Chiuzbăian, T Schmitt, M Matsubara, A Kotani, G Ghiringhelli, ...
Physical Review B—Condensed Matter and Materials Physics 78 (24), 245102, 2008
A simple spherical grating by-pass monochromator dedicated to soft x-ray emission spectroscopy
G Ghiringhelli, A Tagliaferri, L Braicovich, NB Brookes
Review of scientific instruments 69 (4), 1610-1615, 1998
Sum Rules in X-Ray Resonant Raman Scattering: Recovering <?format ?>the Co Ground State Information in as a Test Case
L Braicovich, A Tagliaferri, G van der Laan, G Ghiringhelli, NB Brookes
Physical review letters 90 (11), 117401, 2003
Patterning-induced strain relief in single lithographic SiGe nanostructures studied by nanobeam x-ray diffraction
D Chrastina, GM Vanacore, M Bollani, P Boye, S Schöder, ...
Nanotechnology 23 (15), 155702, 2012
Charge-transfer excitations in lanthanum compounds measured by resonant inelastic x-ray scattering at the edge
C Dallera, K Giarda, G Ghiringhelli, A Tagliaferri, L Braicovich, ...
Physical Review B 64 (15), 153104, 2001
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