GaN technology for power electronic applications: A review TJ Flack, BN Pushpakaran, SB Bayne Journal of Electronic Materials 45, 2673-2682, 2016 | 404 | 2016 |
Characterization of an n-type 4-kV GTO for pulsed power applications T Flack, C Hettler, S Bayne IEEE Transactions on Plasma Science 44 (10), 1947-1955, 2016 | 12 | 2016 |
Reliability optimization in the islanded mode of microgrid S Ramabhotla, SB Bayne, TJ Flack, M Giesselmann J. Energy Power Eng 11, 103-114, 2017 | 3 | 2017 |
DI/DT evaluation of a SI N-type GTO designed for pulsed power applications T Flack, C Hettler, S Bayne 2015 IEEE Pulsed Power Conference (PPC), 1-3, 2015 | 2 | 2015 |
Evaluation of high frequency solid state switches for pulsed power applications using a 12 kW variable voltage testbed T Flack, J Parson, K Bittner, B Driver, N Zameroski, S Bayne, C Hettler 2017 IEEE 21st International Conference on Pulsed Power (PPC), 1-4, 2017 | 1 | 2017 |
Characterization of an n-type 4 kV Silicon GTO for pulsed power applications T Flack | 1 | 2015 |
First Year Electrical Engineering Student Development in Laboratory Based Curriculum T Flack, GA Bayne, W Ray, J Schrock, S Bayne, M Schmidt | | 2015 |
III. Device Under Test 14 T Flack, S Bayne, M Giesselmann, C Hettler, M Sheridan | | |