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Marek Turowski
Marek Turowski
Alphacore Inc., USA
Bestätigte E-Mail-Adresse bei ieee.org
Titel
Zitiert von
Zitiert von
Jahr
Compact damping models for laterally moving microstructures with gas-rarefaction effects
T Veijola, M Turowski
Journal of Microelectromechanical Systems 10 (2), 263-273, 2001
1842001
Nonuniform total-dose-induced charge distribution in shallow-trench isolation oxides
M Turowski, A Raman, RD Schrimpf
IEEE transactions on nuclear science 51 (6), 3166-3171, 2004
1762004
Intermediate-band solar cells based on quantum dot supracrystals
Q Shao, AA Balandin, AI Fedoseyev, M Turowski
Applied Physics Letters 91 (16), 2007
1472007
Method of three-dimensional network solution of leakage field of three-phase transformers
J Turowski, M Turowski, M Kopec
IEEE Transactions on Magnetics 26 (5), 2911-2919, 1990
1161990
Fast, automated thermal simulation of three-dimensional integrated circuits
P Wilkerson, A Raman, M Turowski
The Ninth Intersociety Conference on Thermal and Thermomechanical Phenomena …, 2004
782004
An evaluation of transistor-layout RHBD techniques for SEE mitigation in SiGe HBTs
AK Sutton, M Bellini, JD Cressler, JA Pellish, RA Reed, PW Marshall, ...
IEEE Transactions on Nuclear Science 54 (6), 2044-2052, 2007
702007
Mixed-mode simulation and analysis of digital single event transients in fast CMOSICs
M Turowski, A Raman, G Jablonski
2007 14th International Conference on Mixed Design of Integrated Circuits …, 2007
622007
Heavy-ion-induced degradation in SiC Schottky diodes: Incident angle and energy deposition dependence
A Javanainen, M Turowski, KF Galloway, C Nicklaw, V Ferlet-Cavrois, ...
IEEE Transactions on Nuclear Science 64 (8), 2031-2037, 2017
512017
Heavy ion microbeam-and broadbeam-induced transients in SiGe HBTs
JA Pellish, RA Reed, D McMorrow, G Vizkelethy, VF Cavrois, J Baggio, ...
IEEE Transactions on Nuclear Science 56 (6), 3078-3084, 2009
502009
Engineering electrodynamics
J Turowski, M Turowski
Crc Press, 2014
462014
Single event transient response of SiGe voltage references and its impact on the performance of analog and mixed-signal circuits
L Najafizadeh, SD Phillips, KA Moen, RM Diestelhorst, M Bellini, PK Saha, ...
IEEE Transactions on Nuclear Science 56 (6), 3469-3476, 2009
432009
Compact thermal modeling analysis for 3D integrated circuits
P Wilkerson, M Furmanczyk, M Turowski
11th International Conference Mixed Design of Integrated Circuits and …, 2004
372004
Temperature-dependence of off-state drain leakage in X-ray irradiated 130 nm CMOS devices
B Jun, RM Diestelhorst, M Bellini, G Espinel, A Appaswamy, APG Prakash, ...
IEEE transactions on nuclear science 53 (6), 3203-3209, 2006
342006
CFD-Micromesh: A fast geometric modeling and mesh generation tool for 3D microsystem simulations
Z Tan, M Furmanczyk, M Turowski, AJ Przekwas
Design, Test, Integration, and Packaging of MEMS/MOEMS 4019, 193-199, 2000
312000
Multiphysics design and simulation environment for microelectromechanical systems
AJ Przekwas, M Turowski, M Furmanczyk, A Hieke, RJ Pryputniewicz
Proc. Internat. Symp. on MEMS: Mechanics and Measurements, 84-89, 2001
292001
Reconciling 3-D mixed-mode simulations and measured single-event transients in SiGe HBTs
M Turowski, JA Pellish, KA Moen, A Raman, JD Cressler, RA Reed, G Niu
IEEE Transactions on Nuclear Science 57 (6), 3342-3348, 2010
282010
Efficient modeling of single event transients directly in compact device models
AM Francis, M Turowski, JA Holmes, HA Mantooth
2007 IEEE International Behavioral Modeling and Simulation Workshop, 73-77, 2007
272007
An investigation of single-event effects and potential SEU mitigation strategies in fourth-generation, 90 nm SiGe BiCMOS
NE Lourenco, SD Phillips, TD England, AS Cardoso, ZE Fleetwood, ...
IEEE transactions on Nuclear Science 60 (6), 4175-4183, 2013
262013
Automated generation of compact models for fluidic microsystems
M Turowski, Z Chen, A Przekwas
Analog Integrated Circuits and Signal Processing 29, 27-36, 2001
262001
Accurate modeling of single-event transients in a SiGe voltage reference circuit
KA Moen, L Najafizadeh, J Seungwoo, A Raman, M Turowski, ...
IEEE Transactions on Nuclear Science 58 (3), 877-884, 2011
252011
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