| Electron mean free path in elemental metals D Gall Journal of applied physics 119 (8), 2016 | 951 | 2016 |
| Pathways of atomistic processes on TiN(001) and (111) surfaces during film growth: an ab initio study D Gall, S Kodambaka, MA Wall, I Petrov, JE Greene Journal of Applied Physics 93 (11), 9086-9094, 2003 | 381 | 2003 |
| Growth of poly- and single-crystal ScN on MgO(001): Role of low-energy irradiation in determining texture, microstructure evolution, and mechanical properties D Gall, I Petrov, N Hellgren, L Hultman, JE Sundgren, JE Greene Journal of Applied Physics 84 (11), 6034-6041, 1998 | 267 | 1998 |
| The search for the most conductive metal for narrow interconnect lines D Gall Journal of Applied Physics 127 (5), 2020 | 224 | 2020 |
| Valence electron concentration as an indicator for mechanical properties in rocksalt structure nitrides, carbides and carbonitrides K Balasubramanian, SV Khare, D Gall Acta Materialia 152, 175-185, 2018 | 208 | 2018 |
| CrN–Ag self-lubricating hard coatings CP Mulligan, D Gall Surface and Coatings Technology 200 (5-6), 1495-1500, 2005 | 196 | 2005 |
| Electron scattering at surfaces and grain boundaries in Cu thin films and wires JS Chawla, F Gstrein, KP O’Brien, JS Clarke, D Gall Physical Review B—Condensed Matter and Materials Physics 84 (23), 235423, 2011 | 194 | 2011 |
| Growth of Y-shaped nanorods through physical vapor deposition J Wang, H Huang, SV Kesapragada, D Gall Nano letters 5 (12), 2505-2508, 2005 | 179 | 2005 |
| Vacancy hardening in single-crystal layers CS Shin, D Gall, N Hellgren, J Patscheider, I Petrov, JE Greene Journal of applied physics 93 (10), 6025-6028, 2003 | 179 | 2003 |
| The influence of surface roughness on electrical conductance of thin Cu films: An ab initio study V Timoshevskii, Y Ke, H Guo, D Gall Journal of Applied Physics 103 (11), 2008 | 176 | 2008 |
| Electronic structure of ScN determined using optical spectroscopy, photoemission, and ab initio calculations D Gall, M Städele, K Järrendahl, I Petrov, P Desjardins, RT Haasch, ... Physical Review B 63 (12), 125119, 2001 | 176 | 2001 |
| Growth of single-crystal CrN on MgO (001): Effects of low-energy ion-irradiation on surface morphological evolution and physical properties D Gall, CS Shin, T Spila, M Odén, MJH Senna, JE Greene, I Petrov Journal of Applied Physics 91 (6), 3589-3597, 2002 | 175 | 2002 |
| Resistivity of thin Cu films with surface roughness Y Ke, F Zahid, V Timoshevskii, K Xia, D Gall, H Guo Physical Review B—Condensed Matter and Materials Physics 79 (15), 155406, 2009 | 170 | 2009 |
| Electronic and bonding analysis of hardness in pyrite-type transition-metal pernitrides ZTY Liu, D Gall, SV Khare Physical review B 90 (13), 134102, 2014 | 158 | 2014 |
| Nanospring pressure sensors grown by glancing angle deposition SV Kesapragada, P Victor, O Nalamasu, D Gall Nano letters 6 (4), 854-857, 2006 | 149 | 2006 |
| Surface and bulk electronic structure of investigated by scanning tunneling microscopy/spectroscopy and optical absorption spectroscopy HA Al-Brithen, AR Smith, D Gall Physical Review B—Condensed Matter and Materials Physics 70 (4), 045303, 2004 | 149 | 2004 |
| Phase composition and microstructure of polycrystalline and epitaxial TaNx layers grown on oxidized Si (001) and MgO (001) by reactive magnetron sputter deposition CS Shin, YW Kim, D Gall, JE Greene, I Petrov Thin Solid Films 402 (1-2), 172-182, 2002 | 149 | 2002 |
| Growth, surface morphology, and electrical resistivity of fully strained substoichiometric epitaxial layers on MgO(001) CS Shin, S Rudenja, D Gall, N Hellgren, TY Lee, I Petrov, JE Greene Journal of Applied Physics 95 (1), 356-362, 2004 | 147 | 2004 |
| Band gap in epitaxial NaCl-structure CrN (001) layers D Gall, CS Shin, RT Haasch, I Petrov, JE Greene Journal of Applied Physics 91 (9), 5882-5886, 2002 | 145 | 2002 |
| Carrier lifetime enhancement in halide perovskite via remote epitaxy J Jiang, X Sun, X Chen, B Wang, Z Chen, Y Hu, Y Guo, L Zhang, Y Ma, ... Nature communications 10 (1), 4145, 2019 | 137 | 2019 |
