Daniel Gall
Daniel Gall
Professor, Materials Science and Engineering, Rensselaer Polytechnic Institute
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Cited by
Cited by
Electron mean free path in elemental metals
D Gall
Journal of applied physics 119 (8), 2016
Pathways of atomistic processes on TiN(001) and (111) surfaces during film growth: an ab initio study
D Gall, S Kodambaka, MA Wall, I Petrov, JE Greene
Journal of Applied Physics 93 (11), 9086-9094, 2003
Growth of poly- and single-crystal ScN on MgO(001): Role of low-energy irradiation in determining texture, microstructure evolution, and mechanical properties
D Gall, I Petrov, N Hellgren, L Hultman, JE Sundgren, JE Greene
Journal of Applied Physics 84 (11), 6034-6041, 1998
The search for the most conductive metal for narrow interconnect lines
D Gall
Journal of Applied Physics 127 (5), 2020
Valence electron concentration as an indicator for mechanical properties in rocksalt structure nitrides, carbides and carbonitrides
K Balasubramanian, SV Khare, D Gall
Acta Materialia 152, 175-185, 2018
CrN–Ag self-lubricating hard coatings
CP Mulligan, D Gall
Surface and Coatings Technology 200 (5-6), 1495-1500, 2005
Electron scattering at surfaces and grain boundaries in Cu thin films and wires
JS Chawla, F Gstrein, KP O’Brien, JS Clarke, D Gall
Physical Review B 84 (23), 235423, 2011
Growth of Y-shaped nanorods through physical vapor deposition
J Wang, H Huang, SV Kesapragada, D Gall
Nano letters 5 (12), 2505-2508, 2005
Vacancy hardening in single-crystal layers
CS Shin, D Gall, N Hellgren, J Patscheider, I Petrov, JE Greene
Journal of applied physics 93 (10), 6025-6028, 2003
The influence of surface roughness on electrical conductance of thin Cu films: An ab initio study
V Timoshevskii, Y Ke, H Guo, D Gall
Journal of Applied Physics 103 (11), 2008
Electronic structure of ScN determined using optical spectroscopy, photoemission, and ab initio calculations
D Gall, M Städele, K Järrendahl, I Petrov, P Desjardins, RT Haasch, ...
Physical Review B 63 (12), 125119, 2001
Resistivity of thin Cu films with surface roughness
Y Ke, F Zahid, V Timoshevskii, K Xia, D Gall, H Guo
Physical Review B 79 (15), 155406, 2009
Growth of single-crystal CrN on MgO (001): Effects of low-energy ion-irradiation on surface morphological evolution and physical properties
D Gall, CS Shin, T Spila, M Odén, MJH Senna, JE Greene, I Petrov
Journal of Applied Physics 91 (6), 3589-3597, 2002
Band gap in epitaxial NaCl-structure CrN (001) layers
D Gall, CS Shin, RT Haasch, I Petrov, JE Greene
Journal of Applied Physics 91 (9), 5882-5886, 2002
Nanospring pressure sensors grown by glancing angle deposition
SV Kesapragada, P Victor, O Nalamasu, D Gall
Nano letters 6 (4), 854-857, 2006
Surface and bulk electronic structure of ScN (001) investigated by scanning tunneling microscopy/spectroscopy and optical absorption spectroscopy
HA Al-Brithen, AR Smith, D Gall
Physical Review B 70 (4), 045303, 2004
Phase composition and microstructure of polycrystalline and epitaxial TaNx layers grown on oxidized Si (001) and MgO (001) by reactive magnetron sputter deposition
CS Shin, YW Kim, D Gall, JE Greene, I Petrov
Thin Solid Films 402 (1-2), 172-182, 2002
Growth, surface morphology, and electrical resistivity of fully strained substoichiometric epitaxial layers on MgO(001)
CS Shin, S Rudenja, D Gall, N Hellgren, TY Lee, I Petrov, JE Greene
Journal of Applied Physics 95 (1), 356-362, 2004
Electronic and bonding analysis of hardness in pyrite-type transition-metal pernitrides
ZTY Liu, D Gall, SV Khare
Physical review B 90 (13), 134102, 2014
Microstructure and electronic properties of the refractory semiconductor ScN grown on MgO (001) by ultra-high-vacuum reactive magnetron sputter deposition
D Gall, I Petrov, LD Madsen, JE Sundgren, JE Greene
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 16 (4 …, 1998
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