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Jonathan Pellish
Jonathan Pellish
NASA Goddard Space Flight Center
Bestätigte E-Mail-Adresse bei nasa.gov - Startseite
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Zitiert von
Zitiert von
Jahr
Impact of low-energy proton induced upsets on test methods and rate predictions
BD Sierawski, JA Pellish, RA Reed, RD Schrimpf, KM Warren, RA Weller, ...
IEEE Transactions on Nuclear Science 56 (6), 3085-3092, 2009
2242009
Single-event upsets and multiple-bit upsets on a 45 nm SOI SRAM
DF Heidel, PW Marshall, JA Pellish, KP Rodbell, KA LaBel, JR Schwank, ...
IEEE Transactions on Nuclear Science 56 (6), 3499-3504, 2009
2002009
Muon-induced single event upsets in deep-submicron technology
BD Sierawski, MH Mendenhall, RA Reed, MA Clemens, RA Weller, ...
IEEE Transactions on Nuclear Science 57 (6), 3273-3278, 2010
1452010
Impact of ion energy and species on single event effects analysis
RA Reed, RA Weller, MH Mendenhall, JM Lauenstein, KM Warren, ...
IEEE Transactions on Nuclear Science 54 (6), 2312-2321, 2007
1412007
Multiple-bit upset in 130 nm CMOS technology
AD Tipton, JA Pellish, RA Reed, RD Schrimpf, RA Weller, MH Mendenhall, ...
IEEE Transactions on Nuclear Science 53 (6), 3259-3264, 2006
1402006
Device-orientation effects on multiple-bit upset in 65 nm SRAMs
AD Tipton, JA Pellish, JM Hutson, R Baumann, X Deng, A Marshall, ...
IEEE Transactions on Nuclear Science 55 (6), 2880-2885, 2008
912008
The contribution of low-energy protons to the total on-orbit SEU rate
NA Dodds, MJ Martinez, PE Dodd, MR Shaneyfelt, FW Sexton, JD Black, ...
IEEE Transactions on Nuclear Science 62 (6), 2440-2451, 2015
902015
Electron-induced single-event upsets in static random access memory
MP King, RA Reed, RA Weller, MH Mendenhall, RD Schrimpf, ...
IEEE Transactions on Nuclear Science 60 (6), 4122-4129, 2013
822013
32 and 45 nm radiation-hardened-by-design (RHBD) SOI latches
KP Rodbell, DF Heidel, JA Pellish, PW Marshall, HHK Tang, CE Murray, ...
IEEE Transactions on Nuclear Science 58 (6), 2702-2710, 2011
722011
An evaluation of transistor-layout RHBD techniques for SEE mitigation in SiGe HBTs
AK Sutton, M Bellini, JD Cressler, JA Pellish, RA Reed, PW Marshall, ...
IEEE Transactions on Nuclear Science 54 (6), 2044-2052, 2007
702007
An investigation of dose rate and source dependent effects in 200 GHz SiGe HBTs
AK Sutton, APG Prakash, B Jun, E Zhao, M Bellini, J Pellish, ...
IEEE Transactions on Nuclear Science 53 (6), 3166-3174, 2006
682006
Effectiveness of SEL hardening strategies and the latchup domino effect
NA Dodds, NC Hooten, RA Reed, RD Schrimpf, JH Warner, NJH Roche, ...
IEEE Transactions on Nuclear Science 59 (6), 2642-2650, 2012
632012
Substrate engineering concepts to mitigate charge collection in deep trench isolation technologies
JA Pellish, RA Reed, RD Schrimpf, ML Alles, M Varadharajaperumal, ...
IEEE Transactions on Nuclear Science 53 (6), 3298-3305, 2006
632006
Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam
NA Dodds, JR Schwank, MR Shaneyfelt, PE Dodd, BL Doyle, M Trinczek, ...
IEEE Transactions on Nuclear Science 61 (6), 2904-2914, 2014
572014
Laser-induced current transients in silicon-germanium HBTs
JA Pellish, RA Reed, D McMorrow, JS Melinger, P Jenkins, AK Sutton, ...
IEEE Transactions on Nuclear Science 55 (6), 2936-2942, 2008
512008
Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements
JR Schwank, MR Shaneyfelt, D McMorrow, V Ferlet-Cavrois, P Dodd, ...
IEEE Transactions on Nuclear Science 57 (4), 1827-1834, 2010
502010
Heavy ion microbeam-and broadbeam-induced transients in SiGe HBTs
JA Pellish, RA Reed, D McMorrow, G Vizkelethy, VF Cavrois, J Baggio, ...
IEEE Transactions on Nuclear Science 56 (6), 3078-3084, 2009
502009
Evaluation of digital micromirror devices for use in space-based multiobject spectrometer application
A Travinsky, D Vorobiev, Z Ninkov, A Raisanen, MA Quijada, SA Smee, ...
Journal of Astronomical Telescopes, Instruments, and Systems 3 (3), 035003 …, 2017
482017
Predicting thermal neutron-induced soft errors in static memories using TCAD and physics-based Monte Carlo simulation tools
KM Warren, BD Sierawski, RA Weller, RA Reed, MH Mendenhall, ...
IEEE electron device letters 28 (2), 180-182, 2007
442007
SEL-sensitive area mapping and the effects of reflection and diffraction from metal lines on laser SEE testing
NA Dodds, NC Hooten, RA Reed, RD Schrimpf, JH Warner, NJH Roche, ...
IEEE Transactions on Nuclear Science 60 (4), 2550-2558, 2013
412013
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