Satyendra Kumar
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Effect of hydrogen plasma treatment on transparent conducting oxides
S Major, S Kumar, M Bhatnagar, KL Chopra
Applied Physics Letters 49 (7), 394-396, 1986
Fiber optic sensing of liquid refractive index
A Banerjee, S Mukherjee, RK Verma, B Jana, TK Khan, M Chakroborty, ...
Sensors and Actuators B: Chemical 123 (1), 594-605, 2007
Influence of crystallite size distribution on the micro-Raman analysis of porous Si
MN Islam, S Kumar
Applied Physics Letters 78 (6), 715-717, 2001
Internal photoemission of holes and the mobility gap of hydrogenated amorphous silicon
CR Wronski, S Lee, M Hicks, S Kumar
Physical review letters 63 (13), 1420, 1989
I nsitu spectroscopic ellipsometry study of the growth of microcrystalline silicon
S Kumar, B Drevillon, C Godet
Journal of applied physics 60 (4), 1542-1544, 1986
A real time ellipsometry study of the growth of amorphous silicon on transparent conducting oxides
S Kumar, B Drevillon
Journal of Applied Physics 65 (8), 3023-3034, 1989
I nsitu investigation of the optoelectronic properties of transparent conducting oxide/amorphous silicon interfaces
B Drevillon, S Kumar, P Roca i Cabarrocas, JM Siefert
Applied physics letters 54 (21), 2088-2090, 1989
Effects of crystallite size distribution on the Raman-scattering profiles of silicon nanostructures
MN Islam, A Pradhan, S Kumar
Journal of applied physics 98 (2), 2005
A critical investigation of a-Si: H photoconductivity generated by subgap absorption of light
S Lee, S Kumar, CR Wronski, N Maley
Journal of Non-Crystalline Solids 114, 316-318, 1989
Influence of surface states on the photoluminescence from silicon nanostructures
MN Islam, S Kumar
Journal of Applied Physics 93 (3), 1753-1759, 2003
Role of exciton blocking layers in improving efficiency of copper phthalocyanine based organic solar cells
V Tripathi, D Datta, GS Samal, A Awasthi, S Kumar
Journal of Non-Crystalline Solids 354 (19-25), 2901-2904, 2008
Ellipsometric investigations on the light induced effects on tris (8-hydroxyquinoline) aluminum (Alq3)
S Kumar, VK Shukla, A Tripathi
Thin Solid Films 477 (1-2), 240-243, 2005
Method of determining the exciton diffusion length using optical interference effect in Schottky diode
S Banerjee, AP Parhi, S Iyer, S Kumar
Applied Physics Letters 94 (22), 2009
Light induced effects on the morphology and optical properties of tris-(8-hydroxyquinoline) aluminium (Alq3) small molecular thin film
VK Shukla, S Kumar, D Deva
Synthetic metals 156 (5-6), 387-391, 2006
Ellipsometric studies on thin film CuPC: C60 blends for solar cell applications
D Datta, V Tripathi, P Gogoi, S Banerjee, S Kumar
Thin solid films 516 (20), 7237-7240, 2008
I nsitu spectroscopic ellipsometry investigation of the nucleation of microcrystalline silicon
B Drevillon, C Godet, S Kumar
Applied physics letters 50 (23), 1651-1653, 1987
Effect of high substrate bias and hydrogen and nitrogen incorporation on spectroscopic ellipsometric and atomic force microscopic studies of tetrahedral amorphous carbon films
OS Panwar, MA Khan, S Kumar, A Basu, BR Mehta, S Kumar
Surface and Coatings Technology 205 (7), 2126-2133, 2010
Fluorine and hydrogen effects on the growth and transport properties of microcrystalline silicon from SiF4 precursor
S Kasouit, S Kumar, R Vanderhaghen, PR i Cabarrocas, I French
Journal of non-crystalline solids 299, 113-117, 2002
Normal and anti Meyer–Neldel rule in conductivity of highly crystallized undoped microcrystalline silicon films
SK Ram, S Kumar, PR i Cabarrocas
Journal of non-crystalline solids 354 (19-25), 2263-2267, 2008
Application of spectroscopic ellipsometry to probe the environmental and photo-oxidative degradation of poly (p-phenylenevinylene)(PPV)
S Kumar, AK Biswas, VK Shukla, A Awasthi, RS Anand, J Narain
Synthetic metals 139 (3), 751-753, 2003
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