| Direct comparison of MRI and X-ray CT technologies for 3D imaging of root systems in soil: potential and challenges for root trait quantification R Metzner, A Eggert, D van Dusschoten, D Pflugfelder, S Gerth, U Schurr, ... Plant methods 11, 1-11, 2015 | 306 | 2015 |
| X-ray based methods for non-destructive testing and material characterization R Hanke, T Fuchs, N Uhlmann Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2008 | 278 | 2008 |
| Packings of micron-sized spherical particles–Insights from bulk density determination, X-ray microtomography and discrete element simulations J Schmidt, EJR Parteli, N Uhlmann, N Woerlein, KE Wirth, T Poeschel, ... Advanced Powder Technology 31 (6), 2293-2304, 2020 | 48 | 2020 |
| Correction of beam hardening in X-ray radiograms M Baur, N Uhlmann, T Pöschel, M Schröter Review of Scientific Instruments 90 (2), 2019 | 48 | 2019 |
| Growth of SiC bulk crystals for application in power electronic devices–process design, 2D and 3D X‐ray in situ visualization and advanced doping P Wellmann, G Neubauer, L Fahlbusch, M Salamon, N Uhlmann Crystal Research and Technology 50 (1), 2-9, 2015 | 45 | 2015 |
| Semiautomated 3D root segmentation and evaluation based on X-ray CT imagery S Gerth, J Claußen, A Eggert, N Wörlein, M Waininger, T Wittenberg, ... Plant Phenomics, 2021 | 40 | 2021 |
| Comparison of different methods for determining the size of a focal spot of microfocus X-ray tubes M Salamon, R Hanke, P Krüger, F Sukowski, N Uhlmann, V Voland Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2008 | 36 | 2008 |
| Multi‐Energy X‐ray Imaging as a Quantitative Method for Materials Characterization M Firsching, F Nachtrab, N Uhlmann, R Hanke Advanced Materials 22 (23), 2655-2656, 2011 | 34 | 2011 |
| Realization of a computed tomography setup to achieve resolutions below 1 μm M Salamon, R Hanke, P Krüger, N Uhlmann, V Voland Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2008 | 25 | 2008 |
| Non-invasive investigation of the cross-sectional solids distribution in CFB risers by X-ray computed tomography T Hensler, M Firsching, JSG Bonilla, T Wörlein, N Uhlmann, KE Wirth Powder Technology 297, 247-258, 2016 | 24 | 2016 |
| High-resolution and high-speed CT in industry and research S Zabler, C Fella, A Dietrich, F Nachtrab, M Salamon, V Voland, ... Developments in X-Ray Tomography VIII 8506, 287-297, 2012 | 21 | 2012 |
| Characterization and comparison of direct and indirect converting X-ray detectors for non-destructive testing (NDT) in low-energy and high-resolution applications N Uhlmann, M Salamon, F Sukowski, V Voland Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2008 | 20 | 2008 |
| X-ray CT phenotyping reveals bi-phasic growth phases of potato tubers exposed to combined abiotic stress JK Van Harsselaar, J Claußen, J Lübeck, N Wörlein, N Uhlmann, ... Frontiers in Plant Science 12, 613108, 2021 | 19 | 2021 |
| Applications and methods with high energy CT systems M Salamon, M Boehnel, N Reims, G Ermann, V Voland, M Schmitt, ... 5th International Symposium on NDT in Aerospace 300, 2013 | 19 | 2013 |
| Image blur in a flat-panel detector due to Compton scattering at its internal mountings A Bub, S Gondrom, M Maisl, N Uhlmann, W Arnold Measurement Science and Technology 18 (5), 1270, 2007 | 18 | 2007 |
| Setup of an electron probe micro analyzer for highest resolution radioscopy R Hanke, F Nachtrab, S Burtzlaff, V Voland, N Uhlmann, F Porsch, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2009 | 17 | 2009 |
| Quantitative material analysis by dual-energy computed tomography for industrial NDT applications F Nachtrab, S Weis, P Keßling, F Sukowski, U Haßler, T Fuchs, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2011 | 16 | 2011 |
| X-ray dynamic defectoscopy utilizing digital image correlation I Jandejsek, F Nachtrab, N Uhlmann, D Vavřík Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2011 | 16 | 2011 |
| Influence of the growth interface shape on the defect characteristics in the facet region of 4H-SiC single crystals M Arzig, M Salamon, TC Hsiao, N Uhlmann, PJ Wellmann Journal of Crystal Growth 532, 125436, 2020 | 15 | 2020 |
| Development of a Timepix based detector for the NanoXCT project F Nachtrab, T Hofmann, C Speier, J Lučić, M Firsching, N Uhlmann, ... Journal of Instrumentation 10 (11), C11009, 2015 | 15 | 2015 |
Randolf HankeProfessor für PhysikBestätigte E-Mail-Adresse bei iis.fraunhofer.de
