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Co-authors
- Juerg LeutholdInstitute of Electromagnetic Fields (IEF), ETH Zurich, Zurich, SwitzerlandVerified email at ethz.ch
- Delwin ElderResearch Scientist, University of WashingtonVerified email at uw.edu
- Larry DaltonProfessor of Chemistry, University of WashingtonVerified email at chem.washington.edu
- Benedikt BaeuerlePolariton Technologies Ltd.Verified email at polariton.ch
- Christian HaffnerTenure Track IMEC, Branco-Weiss Fellow, Guest Researcher NISTVerified email at imec.be
- Yannick SalaminAssistant Professor, CREOL, University of Central FloridaVerified email at ucf.edu
- Christian HafnerETH ZurichVerified email at ethz.ch
- Christian KoosProfessor of Photonics, Karlsruhe Institute of TechnologyVerified email at kit.edu
- Robert PalmerHuawei Technologies, MünchenVerified email at huawei.com
- Matthias LauermannVanguard Automation GmbHVerified email at vanguard-automation.com
- Jens NiegemannAnsys Canada Inc.Verified email at ansys.com