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Co-authors
- Zhenyu LiAssociate Professor of BME at GWVerified email at gwu.edu
- Onur TigliUniversity of MiamiVerified email at miami.edu
- Quan DongPhD, George Washington UniversityVerified email at gwu.edu
- Ioana VoiculescuThe City College of New YorkVerified email at ccny.cuny.edu
- Bowei ZhangVerified email at gwmail.gwu.edu
- Albert DavydovGroup Leader, National Institute of Standards and TechnologyVerified email at nist.gov
- Mansoor Dashti ArdakaniPh.D., University of Quebec, INRSVerified email at inrs.ca
- Ritu BajpaiON SemiconductorVerified email at onsemi.com
- Mehmet OzgurResearch Engineer, TwoSix TechnologiesVerified email at mems-exchange.org
- Anis Nurashikin NordinProfessor of Computer Engineering, International Islamic University MalaysiaVerified email at iium.edu.my
- Abhishek MotayedAssistant Research Scientist, University of Maryland, College ParkVerified email at umd.edu
- Nam TranPenn State UniversityVerified email at psu.edu
- r. andrew mcgill Naval research laboratoryVerified email at nrl.navy.mil
- Mulpuri V RaoGeorge Mason UniversityVerified email at gmu.edu
- Vladimir P. OleshkoNational Institute of Standards and TechnologyVerified email at nist.gov
- Richard AllenPhysicist, NISTVerified email at ieee.org
- bhaven mehtaThe George Washington UniversityVerified email at email.gwu.edu
- Richard E CavicchiNational Institute of Standards and Technology (NIST)Verified email at nist.gov
- Boqun DongThe George Washington UniversityVerified email at gwmail.gwu.edu
- Tony IvanovUS Army Research LaboratoryVerified email at ieee.org