Niklas Hellgren
Niklas Hellgren
Department Chair, Professor of Physics, Messiah University
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Role of nitrogen in the formation of hard and elastic CN x thin films by reactive magnetron sputtering
N Hellgren, MP Johansson, E Broitman, L Hultman, JE Sundgren
Physical Review B 59 (7), 5162, 1999
Growth of poly- and single-crystal ScN on MgO(001): Role of low-energy irradiation in determining texture, microstructure evolution, and mechanical properties
D Gall, I Petrov, N Hellgren, L Hultman, JE Sundgren, JE Greene
Journal of Applied Physics 84 (11), 6034-6041, 1998
Cross-Linked Nano-onions of Carbon Nitride in the Solid Phase: Existence of a Novel Aza-Fullerene
L Hultman, S Stafström, Z Czigány, J Neidhardt, N Hellgren, IF Brunell, ...
Physical review letters 87 (22), 225503, 2001
Interpretation of X-ray photoelectron spectra of carbon-nitride thin films: New insights from in situ XPS
N Hellgren, RT Haasch, S Schmidt, L Hultman, I Petrov
Carbon 108, 242-252, 2016
Vacancy hardening in single-crystal layers
CS Shin, D Gall, N Hellgren, J Patscheider, I Petrov, JE Greene
Journal of applied physics 93 (10), 6025-6028, 2003
Carbon nitride nanotubulite–densely-packed and well-aligned tubular nanostructures
K Suenaga, MP Johansson, N Hellgren, E Broitman, LR Wallenberg, ...
Chemical Physics Letters 300 (5-6), 695-700, 1999
Electronic structure of carbon nitride thin films studied by X-ray spectroscopy techniques
N Hellgren, J Guo, Y Luo, C Såthe, A Agui, S Kashtanov, J Nordgren, ...
Thin Solid Films 471 (1-2), 19-34, 2005
Fullerene-like carbon nitride: a resilient coating material
L Hultman, J Neidhardt, N Hellgren, H Sjöström, JE Sundgren
MRS bulletin 28 (3), 194-202, 2003
Growth, surface morphology, and electrical resistivity of fully strained substoichiometric epitaxial layers on MgO(001)
CS Shin, S Rudenja, D Gall, N Hellgren, TY Lee, I Petrov, JE Greene
Journal of Applied Physics 95 (1), 356-362, 2004
Mechanical and tribological properties of CNx films deposited by reactive magnetron sputtering
E Broitman, N Hellgren, O Wänstrand, MP Johansson, T Berlind, ...
Wear 248 (1-2), 55-64, 2001
Nitrogen bonding structure in carbon nitride thin films studied by soft x-ray spectroscopy
N Hellgren, J Guo, C Såthe, A Agui, J Nordgren, Y Luo, H Ågren, ...
Applied Physics Letters 79 (26), 4348-4350, 2001
Microstructure, mechanical properties, and wetting behavior of Si–C–N thin films grown by reactive magnetron sputtering
T Berlind, N Hellgren, MP Johansson, L Hultman
Surface and Coatings Technology 141 (2-3), 145-155, 2001
Development of preferred orientation in polycrystalline NaCl-structure δ-TaN layers grown by reactive magnetron sputtering: Role of low-energy ion surface interactions
CS Shin, D Gall, YW Kim, N Hellgren, I Petrov, JE Greene
Journal of applied physics 92 (9), 5084-5093, 2002
Effect of chemical sputtering on the growth and structural evolution of magnetron sputtered CNx thin films
N Hellgren, MP Johansson, E Broitman, P Sandström, L Hultman, ...
Thin Solid Films 382 (1-2), 146-152, 2001
Nitrogen 1s electron binding energy assignment in carbon nitride thin films with different structures
WT Zheng, KZ Xing, N Hellgren, M Lögdlund, Å Johansson, U Gelivs, ...
Journal of electron spectroscopy and related phenomena 87 (1), 45-49, 1997
Predicted stability of a new aza [60] fullerene molecule, C48N12
S Stafström, L Hultman, N Hellgren
Chemical physics letters 340 (3-4), 227-231, 2001
Carbon nitride films on orthopedic substrates
E Broitman, W Macdonald, N Hellgren, G Radnoczi, Z Czigány, ...
Diamond and Related materials 9 (12), 1984-1991, 2000
Influence of plasma parameters on the growth and properties of magnetron sputtered thin films
N Hellgren, K Macák, E Broitman, MP Johansson, L Hultman, ...
Journal of Applied Physics 88 (1), 524-532, 2000
Electrical and optical properties of films deposited by reactive magnetron sputtering
E Broitman, N Hellgren, K Järrendahl, MP Johansson, S Olafsson, ...
Journal of applied physics 89 (2), 1184-1190, 2001
A core level and valence band photoemission study of 6H-SiC (0001)
LI Johansson, PA Glans, N Hellgren
Surface science 405 (2-3), 288-297, 1998
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