Follow
Mahmud Reaz
Mahmud Reaz
Microchip Technology Incorporated
Verified email at vanderbilt.edu
Title
Cited by
Cited by
Year
Understanding the average electron–hole pair-creation energy in silicon and germanium based on full-band Monte Carlo simulations
J Fang, M Reaz, SL Weeden-Wright, RD Schrimpf, RA Reed, RA Weller, ...
IEEE Transactions on Nuclear Science 66 (1), 444-451, 2018
352018
Synthesis, Characterization, and Optimization of Magnetoelectric BaTiO3–Iron Oxide Core–Shell Nanoparticles
M Reaz, A Haque, K Ghosh
Nanomaterials 10 (3), 563, 2020
292020
Magneto-luminescent zinc/iron oxide core-shell nanoparticles with tunable magnetic properties
M Reaz, A Haque, DM Cornelison, A Wanekaya, R Delong, K Ghosh
Physica E: Low-dimensional Systems and Nanostructures 123, 114090, 2020
212020
Fabrication and thickness-dependent magnetic studies of tunable multiferroic heterostructures (CFO/LSMO/LAO)
A Haque, AR Mahbub, M Abdullah-Al Mamun, M Reaz, K Ghosh
Applied Physics A 125, 1-9, 2019
192019
3-D full-band Monte Carlo simulation of hot-electron energy distributions in gate-all-around Si nanowire MOSFETs
M Reaz, AM Tonigan, K Li, MB Smith, MW Rony, M Gorchichko, A O’Hara, ...
IEEE Transactions on Electron Devices 68 (5), 2556-2563, 2021
172021
Impacts of through-silicon vias on total-ionizing-dose effects and low-frequency noise in FinFETs
K Li, EX Zhang, M Gorchichko, PF Wang, M Reaz, SE Zhao, G Hiblot, ...
IEEE Transactions on Nuclear Science 68 (5), 740-747, 2021
132021
Low-frequency and random telegraph noise in 14-nm bulk si charge-trap transistors
M Gorchichko, EX Zhang, M Reaz, K Li, PF Wang, J Cao, RM Brewer, ...
IEEE Transactions on Electron Devices 70 (6), 3215-3222, 2023
62023
Negative-bias-stress and total-ionizing-dose effects in deeply scaled Ge-GAA nanowire pFETs
MW Rony, EX Zhang, S Toguchi, X Luo, M Reaz, K Li, D Linten, J Mitard, ...
IEEE Transactions on Nuclear Science 69 (3), 299-306, 2022
52022
Single-event-induced charge collection in Ge-channel pMOS FinFETs
MW Rony, IK Samsel, EX Zhang, A Sternberg, K Li, M Reaz, SM Austin, ...
IEEE Transactions on Nuclear Science 68 (5), 807-814, 2021
52021
Carbon nanofiber modified with osmium based redox polymer for glucose sensing
M Amus, M Reaz, K Ghosh, AK Wanekaya
J. Electrochem. Sci. Eng. 7 (4), 181, 2017
42017
The foundations of Shockley's equation for the average electron–hole-pair creation energy in semiconductors
ST Pantelides, DG Walker, M Reaz, MV Fischetti, RD Schrimpf
Applied Physics Letters 121 (4), 2022
22022
A system-level modeling approach for simulating radiation effects in successive-approximation analog-to-digital converters
MW Rony, EX Zhang, M Reaz, K Li, A Daniel, B Rax, P Adell, J Kauppila, ...
IEEE Transactions on Nuclear Science 68 (7), 1465-1472, 2021
22021
Pulsed laser-induced single-event transients in InGaAs FinFETs with sub-10-nm fin widths
K Li, EX Zhang, S Bonaldo, AL Sternberg, JA Kozub, AM Tonigan, M Reaz, ...
2019 19th European Conference on Radiation and Its Effects on Components and …, 2019
22019
Multifunctional Transition Metal Oxide Core Shell Magnetic Nanoparticles
M Reaz
22017
Proton and Heavy-Ion Characterizations on Microchip PolarFire® SoC FPGA Microprocessor Subsystem
S Toguchi, N Rezzak, D McNamara, I Bryant, M Madugoda, RC Quispe, ...
2024 IEEE Radiation Effects Data Workshop (REDW)(in conjunction with 2024 …, 2024
2024
Transceivers and SEL/NVM Heavy Ion Characterization on Microchip RT PolarFire® FPGA
N Rezzak, R Chipana, M Reaz, G Bakker, F Hawley, E Hamdy
2023 RADECS Data Workshop, 1-5, 2023
2023
Total Ionizing Dose and Proton Characterization of 12 LP+ FinFET Technology
N Rezzak, R Chipana, M Reaz, A Cai, G Bakker, F Hawley, E Hamdy
2023 RADECS Data Workshop, 1-5, 2023
2023
Systematic Propagation of Component-Level Failure Effects for Spacecraft Reliability Evaluation
M Reaz, R Alles, A Witulski, G Karsai, N Mahadevan, B Sierawski, R Reed, ...
TRISMAC 2021 Trilateral Safety & Mission Assurance Conference (TRISMAC), 2021
2021
Unified Mechanism for Graphene FET's Electrothermal Breakdown and Its Implications on Safe Operating Limits
M Reaz, AM Tonigan, K Li, MB Smith, MW Rony, M Gorchichko, A O'Hara, ...
IEEE TRANSACTIONS ON ELECTRON DEVICES 68 (5), 2556-2563, 2021
2021
Semiclassical Simulations of Hot Electrons in Gate-All-Around Silicon MOSFETS
M Reaz
Vanderbilt University, 2021
2021
The system can't perform the operation now. Try again later.
Articles 1–20