Get my own profile
Public access
View all9 articles
2 articles
available
not available
Based on funding mandates
Co-authors
Ron SchrimpfProfessor of Electrical Engineering, Vanderbilt UniversityVerified email at vanderbilt.edu
Robert A ReedVanderbilt UniversityVerified email at vanderbilt.edu
Kartik GhoshProfessor of Physics and Materials Science, Missouri State UniversityVerified email at MissouriState.edu
Enxia ZhangUniversity of Central FloridaVerified email at ucf.edu
Kan LiPh. D. Vanderbilt UniversityVerified email at vanderbilt.edu
Daniel M. FleetwoodProfessor of Electrical Engineering, Vanderbilt UniversityVerified email at vanderbilt.edu
Ariful Haque, PhDTexas State University, Intel Corp., NC State University, MO State UniversityVerified email at txstate.edu
Michael AllesVanderbilt UniversityVerified email at vanderbilt.edu
Mohammed Wahiduzzaman RonyIntel CorporationVerified email at vanderbilt.edu
Massimo V FischettiThe University of Texas at DallasVerified email at utdallas.edu
Robert A. WellerVanderbilt UniversityVerified email at vanderbilt.edu
SOKRATES T. PANTELIDESProfessor of Physics, Vanderbilt UniversityVerified email at vanderbilt.edu
Jingtian FangSynopsys Inc.Verified email at synopsys.com
Dimitri LintenImecVerified email at imec.be
Adam WanekayaMissouri State UniversityVerified email at missouristate.edu
Mariia GorchichkoApplied Materials Inc.Verified email at vanderbilt.edu
Robert K. DelongLandmark BioVerified email at landmarkbio.com
Brian SierawskiResearch Associate Professor, Vanderbilt UniversityVerified email at vanderbilt.edu
Md Abdullah Al MamunPh.D. Candidate, Electrical Engineering, University of South CarolinaVerified email at email.sc.edu
Andrew O'HaraWestern Michigan UniversityVerified email at wmich.edu