Folgen
Nahid Hosseini
Nahid Hosseini
école polytechnique fédérale Lausanne
Bestätigte E-Mail-Adresse bei epfl.ch
Titel
Zitiert von
Zitiert von
Jahr
Studying biological membranes with extended range high-speed atomic force microscopy
A Nievergelt, E Blake, N Hosseini, J Adams, G Fantner
Scientific report, 2015
542015
Design of a high‐bandwidth tripod scanner for high speed atomic force microscopy
C Yang, J Yan, M Dukic, N Hosseini, J Zhao, GE Fantner
Scanning 38 (6), 889-900, 2016
292016
A monolithic MEMS position sensor for closed-loop high-speed atomic force microscopy.
N Hosseini, A Nievergelt, J Adams, G Fantner
272016
Air and Water‐Stable n‐Type Doping and Encapsulation of Flexible MoS2 Devices with SU8
YC Kung, N Hosseini, D Dumcenco, GE Fantner, A Kis
Advanced Electronic Materials 5 (1), 1800492, 2019
232019
Digitally controlled analog proportional-integral-derivative (PID) controller for high-speed scanning probe microscopy
M Dukic, V Todorov, S Andany, AP Nievergelt, C Yang, N Hosseini, ...
Review of Scientific Instruments 88 (12), 2017
202017
Optimized design and implementation of low-cost, sensitive and versatile Vibrating Sample Magnetometer
N Hosseini, S Khiabani, F Sarreshtedari, M Fardmanesh
20th Iranian Conference on Electrical Engineering (ICEE2012), 202-205, 2012
82012
Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process
N Hosseini, M Neuenschwander, O Peric, SH Andany, JD Adams, ...
Beilstein journal of nanotechnology 10 (1), 2357-2363, 2019
72019
An efficient SQUID NDE defect detection approach by using an adaptive finite-element modeling
F Sarreshtedari, S Razmkhah, N Hosseini, J Schubert, M Banzet, ...
Journal of superconductivity and novel magnetism 24, 1077-1081, 2011
52011
Correlative In-Situ Analysis on the Nanoscale by combination of AFM and SEM
M Winhold, M Leitner, P Frank, N Hosseini, J Sattelkov, GE Fantner, ...
Microscopy and Microanalysis 24 (S1), 1922-1923, 2018
32018
Self-Actuated Polymer-Based Cantilevers with Sharp Silicon Tips for High-Speed Atomic Force Microscopy
M Neuenschwander, SH Andany, M Kangül, N Hosseini, GE Fantner
2021 21st International Conference on Solid-State Sensors, Actuators and …, 2021
22021
Crystallographic and Nanomechanical Analysis by Correlative In-situ AFM & SEM
P Frank, M Leitner, S Hummel, N Hosseini, Y Wang, R Winkler, ...
Microscopy and Microanalysis 24 (S1), 2280-2281, 2018
22018
Measurement of critical current density in bulk superconductors based on small point contact characterization
N Hosseini, A Zabetian, S Kananian, M Fardmanesh
Journal of superconductivity and novel magnetism 26, 1485-1488, 2013
22013
Batch Fabrication of Multilayer Polymer Cantilevers with Integrated Hard Tips for High-Speed Atomic Force Microscopy
N Hosseini, O Peric, M Neuenschwander, SH Andany, JD Adams, ...
2019 20th International Conference on Solid-State Sensors, Actuators and …, 2019
12019
A novel microfabrication platform for hybrid multilayer MEMS
N Hosseini
EPFL, 2019
12019
Rise time reduction of thermal actuators operated in air and water through optimized pre-shaped open-loop driving
T Larsen, JC Doll, F Loizeau, N Hosseini, AW Peng, GE Fantner, AJ Ricci, ...
Journal of Micromechanics and Microengineering 27 (4), 045005, 2017
12017
Multilayer mems cantilevers
GE Fantner, JD Adams, N Hosseini
12016
A hybrid polymer/ceramic/semiconductor fabrication platform for high-sensitivity fluid-compatible MEMS devices with sealed integrated electronics
N Hosseini, M Neuenschwander, JD Adams, SH Andany, O Peric, ...
arXiv preprint arXiv:2307.05221, 2023
2023
Multilayer MEMS cantilevers
GE Fantner, JD Adams, N Hosseini
US Patent 10,308,500, 2019
2019
Correlative AFM/SEM crystallographic and nanomechanicalproperty analysis of FIB-treated samples
M Winhold, H Plank, R Winkler, MTM Hannebelle, N Hosseini, G Fantner, ...
European FIB Network, 54-56, 2017
2017
Studying biological membranes with extended range high-speed atomic force microscopy (vol 5, 11987, 2015)
AP Nievergelt, BW Erickson, N Hosseini, JD Adams, GE Fantner
SCIENTIFIC REPORTS 6, 2016
2016
Das System kann den Vorgang jetzt nicht ausführen. Versuchen Sie es später erneut.
Artikel 1–20