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MJ Soileau
MJ Soileau
Prof. of Optics, Physics and EECS and VP for Research, UCF
Verified email at ucf.edu
Title
Cited by
Cited by
Year
Two photon absorption, nonlinear refraction, and optical limiting in semiconductors
EW Van Stryland, H Vanherzeele, MA Woodall, MJ Soileau, AL Smirl, ...
Optical Engineering 24 (4), 613-623, 1985
5941985
Nonlinear optical properties of carbon-black suspensions (ink)
K Mansour, MJ Soileau, EW Van Stryland
JOSA B 9 (7), 1100-1109, 1992
4471992
Energy band-gap dependence of two-photon absorption
EW Van Stryland, MA Woodall, H Vanherzeele, MJ Soileau
Optics letters 10 (10), 490-492, 1985
4361985
Nonlinear refraction and optical limiting in
M Sheik-Bahae, AA Said, DJ Hagan, MJ Soileau, EW Van Stryland
Optical engineering 30 (8), 1228-1235, 1991
3441991
Optical limiting with semiconductors
EW Van Stryland, YY Wu, DJ Hagan, MJ Soileau, K Mansour
JOSA B 5 (9), 1980-1988, 1988
3091988
Optical switching and n2 measurements in CS2
WE Williams, MJ Soileau, EW Van Stryland
Optics communications 50 (4), 256-260, 1984
2831984
Color-center generation in silicate glasses exposed to infrared femtosecond pulses
OM Efimov, K Gabel, SV Garnov, LB Glebov, S Grantham, M Richardson, ...
JOSA B 15 (1), 193-199, 1998
1811998
Polarization charge model for laser-induced ripple patterns in dielectric materials
P Temple, M Soileau
IEEE Journal of Quantum Electronics 17 (10), 2067-2072, 1981
1761981
Pulse-width and focal-volume dependence of laser-induced breakdown
EW Van Stryland, MJ Soileau, AL Smirl, WE Williams
Physical Review B 23 (5), 2144, 1981
1641981
Laser-induced damage and the role of self-focusing
MJ Soileau, WE Williams, N Mansour, EW Van Stryland
Optical Engineering 28 (10), 1133-1144, 1989
1631989
Optical power limiter with picosecond response time
M Soileau, W Williams, E Van Stryland
IEEE Journal of Quantum Electronics 19 (4), 731-735, 1983
1441983
Self-protecting semiconductor optical limiters
DJ Hagan, EW Van Stryland, MJ Soileau, YY Wu, S Guha
Optics letters 13 (4), 315-317, 1988
941988
Measurement of the optical damage threshold in fused quartz
AA Said, T Xia, A Dogariu, DJ Hagan, MJ Soileau, EW Van Stryland, ...
Applied optics 34 (18), 3374-3376, 1995
621995
Self-defocusing in CdSe induced by charge carriers created by two-photon absorption
S Guha, EW Van Stryland, MJ Soileau
Optics letters 10 (6), 285-287, 1985
581985
Ripple structures associated with ordered surface defects in dielectrics
M Soileau
IEEE journal of quantum electronics 20 (5), 464-467, 1984
561984
Z-scan: a simple and sensitive technique for nonlinear refraction measurements
M Sheik-Bahae, AA Said, TH Wei, YY Wu, DJ Hagan, MJ Soileau, ...
Nonlinear Optical Properties Of Materials 1148, 41-51, 1990
511990
High peak power Ytterbium doped fiber amplifiers
W Torruellas, Y Chen, B McIntosh, J Farroni, K Tankala, S Webster, ...
Fiber Lasers III: Technology, Systems, and Applications 6102, 149-155, 2006
472006
Diffusion of color centers generated by two‐photon absorption at 532 nm in cubic zirconia
N Mansour, K Mansour, EW Van Stryland, MJ Soileau
Journal of applied physics 67 (3), 1475-1477, 1990
451990
Picosecond damage studies at 0.5 and 1 Ám
MJ Soileau, WE Williams, EW Van Stryland, TF Boggess, AL Smirl
Optical Engineering 22 (4), 424-430, 1983
421983
Temporal dependence of laser-induced breakdown in NaCl and SiO2
MJ Soileau, WE Williams, EW Van Stryland, TF Boggess, AL Smirl
Laser-Induced Damage in Optical Materials: 1982 669, 387-405, 1984
401984
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