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Co-authors
- George R. NeilJefferson Laboratory LCLS-II Senior Technical LeadVerified email at jlab.org
- Gwyn P. WilliamsJefferson LabVerified email at jlab.org
- James R. BoyceJefferson LabVerified email at jlab.org
- Andrei AfanasevProfessor of Physics, George Washington UniversityVerified email at gwu.edu
- Peter SchaafTU Ilmenau - Institute of Materials Science and Engineering and Institute of Micro- andVerified email at tu-ilmenau.de
- Dr. Pavel EvtushenkoCarl Zeiss MultiSEM GmbHVerified email at zeiss.com
- Dr. Daniel HöcheHelmholtz-Zentrum Hereon / Interface modellingVerified email at hereon.de
- Carmen S. MenoniUniversity Distinguished Professor, Electrical & Computer Engineering, Colorado State UniversityVerified email at colostate.edu
- Raymond J BeachLawrence Livermore National LaboratoryVerified email at llnl.gov
- Stephen A. PayneLawrence Livermore National LaboratoryVerified email at llnl.gov
- Dhiraj SardarUniversity of Texas at San AntonioVerified email at utsa.edu
- Lynn A BoatnerDirector, ORNL Center for Radiation Detection Materials and SystemsVerified email at ornl.gov
- Xi-Cheng ZhangThe Institute of Optics, University of RochesterVerified email at rochester.edu
- Michael C. MartinAdvanced Light Source, Lawrence Berkeley National LaboratoryVerified email at lbl.gov