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Sergey NikishinProfessor of Electrical Engineering, Texas Tech UniversityVerified email at ttu.edu
Ayrton BernussiProfessor of Electrical and Computer EngineeringVerified email at ttu.edu
Jordan BergUS National Science FoundationVerified email at nsf.gov
Zhaoyang FanProfessor of Electrical Engineering, Arizona State UniversityVerified email at asu.edu
M.NazariVisiting Scholar, Texas State UniversityVerified email at txstate.edu
Edwin PinerProfessor, Texas State UniversityVerified email at txstate.edu
Sandeep Sohal, PhDSenior Reliability Engineer, Infinera CorporationVerified email at infinera.com
yanhan zhuIntel Corp.Verified email at intel.com
Yong Zhao, Ph.D.View, Inc.Verified email at viewglass.com
shubhra gangopadhyayProfessor of Electrical EngineeringVerified email at missouri.edu
D. H. S. MaithripalaUniversity of Peradeniya, Sri LankaVerified email at eng.pdn.ac.lk
Stefan ZollnerNew Mexico State UniversityVerified email at nmsu.edu
Iulian GherasoiuSUNY Polytechnic InstituteVerified email at sunyit.edu
Luis Grave de PeraltaProfessor of Physics, Texas Tech UniversityVerified email at ttu.edu
Gulten KARAOGLAN-BEBEKIntelVerified email at intel.com
R ZallenProfessor of Physics, Virginia TechVerified email at vt.edu
Raju Ahmed, Ph. D.Sr R&D Engineer at Micron TechnologyVerified email at micron.com
Xuan PanPhD of Electrical Engineering, Nano Tech Center, Texas Tech UniversityVerified email at ttu.edu
Dan FeketeProfessor of Physics, Physics Dept., TechnionVerified email at tx.technion.ac.il
Anwar SiddiqueProduct Engineer, Intel CorpVerified email at intel.com