Three-dimensional microstructural characterization using focused ion beam tomography MD Uchic, L Holzer, BJ Inkson, EL Principe, P Munroe MRS bulletin 32 (5), 408-416, 2007 | 264 | 2007 |
A sinusoidally-architected helicoidal biocomposite NA Yaraghi, N Guarín-Zapata, LK Grunenfelder, E Hintsala, S Bhowmick, ... arXiv preprint arXiv:1604.07798, 2016 | 198 | 2016 |
thickness determination by x-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, Rutherford backscattering … DA Cole, JR Shallenberger, SW Novak, RL Moore, MJ Edgell, SP Smith, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000 | 118 | 2000 |
Thin dielectric film thickness determination by advanced transmission electron microscopy AC Diebold, B Foran, C Kisielowski, DA Muller, SJ Pennycook, E Principe, ... Microscopy and Microanalysis 9 (6), 493-508, 2003 | 78 | 2003 |
Process control for optimal PCR performance in glass microstructures TB Taylor, SE Harvey, M Albin, L Lebak, Y Ning, I Mowat, T Schuerlein, ... Biomedical Microdevices 1, 65-70, 1998 | 50 | 1998 |
Oxide thickness determination by xps, aes, sims, rbs and tem JR Shallenberger, DA Cole, SW Novak, RL Moore, MJ Edgell, SP Smith, ... 1998 International Conference on Ion Implantation Technology. Proceedings …, 1998 | 39 | 1998 |
Steps toward automated deprocessing of integrated circuits EL Principe, N Asadizanjani, D Forte, M Tehranipoor, R Chivas, ... ISTFA 2017: Proceedings from the 43rd International Symposium for Testing …, 2017 | 38 | 2017 |
Method and apparatus for quantitative three-dimensional reconstruction in scanning electron microscopy E Principe US Patent 7,312,448, 2007 | 35 | 2007 |
Benefits of microscopy with super resolution C Kisielowski, E Principe, B Freitag, D Hubert Physica B: Condensed Matter 308, 1090-1096, 2001 | 33 | 2001 |
Role of oxide/metal interface in corrosion resistance: Al-W and Al-Mo systems EL Principe, BA Shaw, GD Davis Corrosion 59 (4), 295-313, 2003 | 30 | 2003 |
FIB‐SIMS quantification using TOF‐SIMS with Ar and Xe plasma sources FA Stevie, L Sedlacek, P Babor, J Jiruse, E Principe, K Klosova Surface and Interface Analysis 46 (S1), 285-287, 2014 | 17 | 2014 |
Plasma FIB deprocessing of integrated circuits from the backside EL Principe, N Asadizanjani, D Forte, M Tehranipoor, R Chivas, ... FICS Research Annual Conference on Cybersecurity, 2017 | 15 | 2017 |
Biocomposites: a sinusoidally architected helicoidal biocomposite (Adv. Mater. 32/2016) NA Yaraghi, N Guarín‐Zapata, LK Grunenfelder, E Hintsala, S Bhowmick, ... Advanced Materials 28 (32), 6769-6769, 2016 | 15 | 2016 |
A three beam approach to TEM preparation using in-situ low voltage argon ion final milling in a FIB-SEM instrument EL Principe, P Gnauck, P Hoffrogge Microscopy and Microanalysis 11 (S02), 830-831, 2005 | 15 | 2005 |
Strain and bond length dynamics upon growth and transfer of graphene by NEXAFS spectroscopy from first-principles and experiment WY Rojas, AD Winter, J Grote, SS Kim, RR Naik, AD Williams, C Weiland, ... Langmuir 34 (4), 1783-1794, 2018 | 14 | 2018 |
High-density FIB-SEM tomography via real-time imaging E Principe US Patent 8,178,838, 2012 | 12* | 2012 |
High-density FIB-SEM tomography via real-time imaging E Principe US Patent 7,750,293, 2010 | 12 | 2010 |
Advanced Package FA Flow for Next-Gen Packaging Technology Using EOTPR, 3D X-Ray and Plasma FIB C Schmidt, PS Pichumani, J Alton, M Igarashi, L Chan, E Principe ISTFA 2016, 427-431, 2016 | 10 | 2016 |
Three dimensional imaging of microelectronic devices using a crossbeam FIB E Lifshin, J Evertsen, E Principe, J Friel ISTFA 2004, 429-435, 2004 | 7 | 2004 |
Technical Note: Observations Regarding the Effects of Nitrogen Addition to the Aluminum-Tungsten System by Reactive Sputter Deposition EL Principe, BA Shaw Corrosion 53 (9), 675-678, 1997 | 7 | 1997 |