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Philippe DollfusCNRS, Université Paris-SaclayVerified email at universite-paris-saclay.fr
Jerome Saint-MartinParis Saclay UniversityVerified email at universite-paris-saclay.fr
Damien QuerliozResearch Scientist, CNRS, Université Paris-SaclayVerified email at u-psud.fr
Viet-Hung NguyenUniversité catholique de Louvain, Louvain-la-Neuve, BelgiumVerified email at uclouvain.be
Weisheng ZhaoFert Beijing Institute, Beihang UniversityVerified email at buaa.edu.cn
Karim HuetSCREEN Semiconductor Solutions Co., Ltd.Verified email at screen-lasse.com
V. Nam DoAssociate Professor, Phenikaa UniversityVerified email at phenikaa-uni.edu.vn
Yue Zhang (张悦)Professor, Beihang University, Beijing, ChinaVerified email at u-psud.fr
Sylvain BARRAUDCEA-LETI, Minatec CampusVerified email at cea.fr
Jiaqi ZhouUCLouvainVerified email at uclouvain.be
Fulvio MazzamutoLASSE - SCREENVerified email at screen-lasse.com
Jacques-Olivier KLEINProfessor, Univ. Paris-Saclay, FranceVerified email at universite-paris-saclay.fr
Guillaume HubertONERA, the French Aerospace Lab.Verified email at onera.fr
Salim BERRADAIntel CorporationVerified email at intel.com
Xiaoyang LinBeihang UniversityVerified email at buaa.edu.cn
Patrick BrunoESRF, Grenoble, FranceVerified email at esrf.fr
Moncef SaidUniversité de Monsatir, Faculté des Sciences, LMCNVerified email at fsm.rnu.tn
Sylvain GIRARDProfessor, Université de Saint-Etienne, Laboratoire Hubert Curien, FranceVerified email at univ-st-etienne.fr
Yann-Michel NiquetCEA/IRIG/MEM/L_SimVerified email at cea.fr
Herve JaouenSTMicroelectronicsVerified email at st.com